Noncontact atomic force microscopy III
نویسندگان
چکیده
Intense interest in nanoscale science and technology has been the main driving force behind a large number of outstanding discoveries in the last few decades. It may not be an overstatement to claim that the development of the various scanning probe methods in the 1980s was the main pre-requisite for the fields of nanoscience and nanotechnology to take off and ultimately evolve to their current states. While scanning tunneling microscopy (STM) relies on quantum mechanical tunneling of electrons to enable the atomic-resolution imaging of (semi-)conducting sample surfaces, it was the atomic force microscope (AFM) that eventually allowed for nanometer-scale imaging of sample surfaces with no limitations on electrical conductivity. As such, the method was widely adopted shortly after its introduction in 1986 and today it is not unusual to have multiple AFMs available at research universities and R&D departments of industrial companies.
منابع مشابه
Surface - tip interactions in noncontact atomic - force microscopy on reactive surfaces : Si „ 111 ...
Total-energy pseudopotential calculations are used to study the imaging process in noncontact atomic-force microscopy on Si~111! surfaces. At the distance of closest approach between the tip and the surface, there is an onset of covalent chemical bonding between the dangling bonds of the tip and the surface. Displacement curves and lateral scans on the surface show that this interaction energy ...
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